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PXI based semi-conductor test

This paper reviews current switching architectures employed today and discusses the benefits / limitations of current COTS offerings.

Virtually all ATE systems employ a switching subsystem in order to route test system resources to multiple test points on the UUT. The challenge for any switching subsystem is multi-dimensional and involves many considerations / trade-offs including footprint, performance, flexibility, maintainability, and reliability. Additionally, if the application needs to address legacy test needs, there can be the additional challenge to support not only current and future switching requirements, but also legacy test requirements. This paper reviews current switching architectures employed today and discusses the benefits / limitations of current COTS offerings. The paper also reviews the switching requirements associated with addressing high complexity / high performance functional test applications and how the development and implementation of a PXI-based switching architecture can meet these requirements.



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