Virtually all ATE systems employ a switching subsystem in order to route test system resources to multiple test points on the UUT. The challenge for any switching subsystem is multi-dimensional and involves many considerations / trade-offs including footprint, performance, flexibility, maintainability, and reliability. Additionally, if the application needs to address legacy test needs, there can be the additional challenge to support not only current and future switching requirements, but also legacy test requirements. Many of today’s functional test systems employ the PXI architecture which offers modularity and flexibility. However when combining switching and instrumentation, test engineers can be challenged to create a system that combines all of the switching and instrumentation capabilities in one compact platform.